ANGLE-RESOLVED SECONDARY ION MASS SPECTROMETRY.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The interaction of keV particles with solids has been characterized by the measurement of the angle and energy distribution of sputtered secondary ions and neutrals. The results are compared to classical dynamics calculations of the ion impact event. Examples using secondary ions are given for clean Ni left brace 001 right brace , Cu left brace 001 right brace reacted with O//2, Ni left brace 001 right brace and Ni left brace 7 9 11 right brace reacted with CO, and Ag left brace 111 right brace reacted with benzene. The neutral Rh atoms desorbed from Rh left brace 001 right brace are characterized by multiphoton resonance ionization of these atoms after they have left the surface.

Original languageEnglish (US)
Title of host publicationACS Symposium Series
EditorsPhilip A. Lyon
PublisherACS
Pages83-96
Number of pages14
ISBN (Print)0841209421
StatePublished - Dec 1 1985

Publication series

NameACS Symposium Series
ISSN (Print)0097-6156

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Chemical Engineering(all)

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  • Cite this

    Winograd, N. (1985). ANGLE-RESOLVED SECONDARY ION MASS SPECTROMETRY. In P. A. Lyon (Ed.), ACS Symposium Series (pp. 83-96). (ACS Symposium Series). ACS.