Angle-resolved SIMS studies of AlxGa(1-x)As {001} (2x4) surface reconstruction

S. H. Goss, P. B.S. Kodali, Barbara Jane Garrison, Nicholas Winograd

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

Angular distributions of Al+ and Ga+ ions desorbed by keV particle bombardment have been measured from a modified AlxGa(1-x)As {001} (2 × 4) surface reconstruction. This surface was prepared from the GaAs{001} c(4 × 4) surface by deposition of one monolayer of aluminum in situ via molecular beam epitaxy. The surface was then annealed to 550 K producing a (2 × 4) reconstruction. By comparing experimental angular distribution results with molecular dynamics simulations of the bombardment process, we show that Al and Ga segregate into different layers of the prepared (2 × 4) surface.

Original languageEnglish (US)
Pages (from-to)44-49
Number of pages6
JournalSurface Science
Volume387
Issue number1-3
DOIs
StatePublished - Oct 8 1997

Fingerprint

Surface reconstruction
Secondary ion mass spectrometry
secondary ion mass spectrometry
Angular distribution
bombardment
angular distribution
Aluminum
Molecular beam epitaxy
Molecular dynamics
Monolayers
Ions
molecular beam epitaxy
molecular dynamics
Computer simulation
aluminum
ions
simulation

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

Cite this

Goss, S. H. ; Kodali, P. B.S. ; Garrison, Barbara Jane ; Winograd, Nicholas. / Angle-resolved SIMS studies of AlxGa(1-x)As {001} (2x4) surface reconstruction. In: Surface Science. 1997 ; Vol. 387, No. 1-3. pp. 44-49.
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Angle-resolved SIMS studies of AlxGa(1-x)As {001} (2x4) surface reconstruction. / Goss, S. H.; Kodali, P. B.S.; Garrison, Barbara Jane; Winograd, Nicholas.

In: Surface Science, Vol. 387, No. 1-3, 08.10.1997, p. 44-49.

Research output: Contribution to journalArticle

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T1 - Angle-resolved SIMS studies of AlxGa(1-x)As {001} (2x4) surface reconstruction

AU - Goss, S. H.

AU - Kodali, P. B.S.

AU - Garrison, Barbara Jane

AU - Winograd, Nicholas

PY - 1997/10/8

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AB - Angular distributions of Al+ and Ga+ ions desorbed by keV particle bombardment have been measured from a modified AlxGa(1-x)As {001} (2 × 4) surface reconstruction. This surface was prepared from the GaAs{001} c(4 × 4) surface by deposition of one monolayer of aluminum in situ via molecular beam epitaxy. The surface was then annealed to 550 K producing a (2 × 4) reconstruction. By comparing experimental angular distribution results with molecular dynamics simulations of the bombardment process, we show that Al and Ga segregate into different layers of the prepared (2 × 4) surface.

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