Anisotropy influence on B-scan imaging and tissue characterization

J. L. Rose, N. Hodiwalla, J. Zhang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Aspects of wave mechanics in inhomogeneous and anisotropic media are presented in the paper that relate to potential speckle pattern variations in B-scan imaging analysis. The hypothesis is explored that diseased or malignancy areas embedded inside larger tissue masses become more or less anisotropic or ordered or disordered compared to the surrounding tissue. It is shown that speckle pattern variations due to impingement angle or scan direction can occur that relates to the anisotropic or ordered character of the tissue. This often neglected impingement angle feature can potentially be used to solve many different problems in tissue characterization. The influence of frequency and frequency bandwidth is also studied with respect to image quality and characterization potential. Sample problems are presented in phantom analysis of unidirectional fibers in a fluid media in an attempt to direct the technological efforts towards in-vivo tissue characterization analysis.

Original languageEnglish (US)
Title of host publication1992 Ultrasonics Symposium Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1077-1082
Number of pages6
ISBN (Electronic)0780305620
DOIs
StatePublished - Jan 1 1992
Event1992 Ultrasonics Symposium - Tucson, United States
Duration: Oct 20 1992Oct 23 1992

Publication series

NameProceedings - IEEE Ultrasonics Symposium
Volume1992-October
ISSN (Print)1051-0117

Conference

Conference1992 Ultrasonics Symposium
CountryUnited States
CityTucson
Period10/20/9210/23/92

All Science Journal Classification (ASJC) codes

  • Acoustics and Ultrasonics

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  • Cite this

    Rose, J. L., Hodiwalla, N., & Zhang, J. (1992). Anisotropy influence on B-scan imaging and tissue characterization. In 1992 Ultrasonics Symposium Proceedings (pp. 1077-1082). [276010] (Proceedings - IEEE Ultrasonics Symposium; Vol. 1992-October). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ULTSYM.1992.276010