Anomalous crack arrays in anisotropic-strained manganite on scandate substrates

Changcheng Ju, Fei Xue, Fengzhen Huang, Long Qing Chen, Xiaomei Lu, Jinsong Zhu, Henrik Myhre Jensen

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

We report that when (La,Sr)MnO3 films grown on orthorhombic (110)o DyScO3 (DSO) substrates once reach a critical thickness, anisotropic patterned cracks are introduced which propagate parallel to [1-10]o direction. The typical surface morphology and cross-sectional TEM are examined in order to clarify the formation of these cracks. The cause of crack propagation through the film and into the substrate is identified as the underlying large anisotropic strain and relatively low stiffness of DSO substrates. The electrical conduction in the crack region is found to be several orders of magnitude higher than that in the uncracked areas of the film. The energy dispersive x-ray-verified La0.7Sr0.3MnO3 deposited into cracks may be responsible for the anomalous conducting behaviors. Finally, a simple model is constructed for estimating substrate fracture toughness and calculating an upper bound of film fracture toughness.

Original languageEnglish (US)
Article number201905
JournalApplied Physics Letters
Volume106
Issue number20
DOIs
StatePublished - May 18 2015

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cracks
fracture strength
conduction
crack propagation
stiffness
estimating
transmission electron microscopy
causes
x rays
energy

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Cite this

Ju, Changcheng ; Xue, Fei ; Huang, Fengzhen ; Chen, Long Qing ; Lu, Xiaomei ; Zhu, Jinsong ; Jensen, Henrik Myhre. / Anomalous crack arrays in anisotropic-strained manganite on scandate substrates. In: Applied Physics Letters. 2015 ; Vol. 106, No. 20.
@article{5117791952424b458da6cb9f2aa2e66d,
title = "Anomalous crack arrays in anisotropic-strained manganite on scandate substrates",
abstract = "We report that when (La,Sr)MnO3 films grown on orthorhombic (110)o DyScO3 (DSO) substrates once reach a critical thickness, anisotropic patterned cracks are introduced which propagate parallel to [1-10]o direction. The typical surface morphology and cross-sectional TEM are examined in order to clarify the formation of these cracks. The cause of crack propagation through the film and into the substrate is identified as the underlying large anisotropic strain and relatively low stiffness of DSO substrates. The electrical conduction in the crack region is found to be several orders of magnitude higher than that in the uncracked areas of the film. The energy dispersive x-ray-verified La0.7Sr0.3MnO3 deposited into cracks may be responsible for the anomalous conducting behaviors. Finally, a simple model is constructed for estimating substrate fracture toughness and calculating an upper bound of film fracture toughness.",
author = "Changcheng Ju and Fei Xue and Fengzhen Huang and Chen, {Long Qing} and Xiaomei Lu and Jinsong Zhu and Jensen, {Henrik Myhre}",
year = "2015",
month = "5",
day = "18",
doi = "10.1063/1.4921522",
language = "English (US)",
volume = "106",
journal = "Applied Physics Letters",
issn = "0003-6951",
publisher = "American Institute of Physics Publising LLC",
number = "20",

}

Anomalous crack arrays in anisotropic-strained manganite on scandate substrates. / Ju, Changcheng; Xue, Fei; Huang, Fengzhen; Chen, Long Qing; Lu, Xiaomei; Zhu, Jinsong; Jensen, Henrik Myhre.

In: Applied Physics Letters, Vol. 106, No. 20, 201905, 18.05.2015.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Anomalous crack arrays in anisotropic-strained manganite on scandate substrates

AU - Ju, Changcheng

AU - Xue, Fei

AU - Huang, Fengzhen

AU - Chen, Long Qing

AU - Lu, Xiaomei

AU - Zhu, Jinsong

AU - Jensen, Henrik Myhre

PY - 2015/5/18

Y1 - 2015/5/18

N2 - We report that when (La,Sr)MnO3 films grown on orthorhombic (110)o DyScO3 (DSO) substrates once reach a critical thickness, anisotropic patterned cracks are introduced which propagate parallel to [1-10]o direction. The typical surface morphology and cross-sectional TEM are examined in order to clarify the formation of these cracks. The cause of crack propagation through the film and into the substrate is identified as the underlying large anisotropic strain and relatively low stiffness of DSO substrates. The electrical conduction in the crack region is found to be several orders of magnitude higher than that in the uncracked areas of the film. The energy dispersive x-ray-verified La0.7Sr0.3MnO3 deposited into cracks may be responsible for the anomalous conducting behaviors. Finally, a simple model is constructed for estimating substrate fracture toughness and calculating an upper bound of film fracture toughness.

AB - We report that when (La,Sr)MnO3 films grown on orthorhombic (110)o DyScO3 (DSO) substrates once reach a critical thickness, anisotropic patterned cracks are introduced which propagate parallel to [1-10]o direction. The typical surface morphology and cross-sectional TEM are examined in order to clarify the formation of these cracks. The cause of crack propagation through the film and into the substrate is identified as the underlying large anisotropic strain and relatively low stiffness of DSO substrates. The electrical conduction in the crack region is found to be several orders of magnitude higher than that in the uncracked areas of the film. The energy dispersive x-ray-verified La0.7Sr0.3MnO3 deposited into cracks may be responsible for the anomalous conducting behaviors. Finally, a simple model is constructed for estimating substrate fracture toughness and calculating an upper bound of film fracture toughness.

UR - http://www.scopus.com/inward/record.url?scp=84930226454&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84930226454&partnerID=8YFLogxK

U2 - 10.1063/1.4921522

DO - 10.1063/1.4921522

M3 - Article

AN - SCOPUS:84930226454

VL - 106

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

IS - 20

M1 - 201905

ER -