Another look at the process capability index

Min Te Chao, Dennis K.J. Lin

Research output: Contribution to journalArticle

16 Citations (Scopus)

Abstract

Process capability indices (PCIs) have been widely used in manufacturing industries. In this paper, we take a very specific view that a proper value of the process capacity index (PCI) represents the true yield of the process. Following this logic, a universal PCI, Cy, is proposed and derived. The superiority of the new PCI is presented in theory and demonstrated through examples.

Original languageEnglish (US)
Pages (from-to)153-163
Number of pages11
JournalQuality and Reliability Engineering International
Volume22
Issue number2
DOIs
StatePublished - Mar 1 2006

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Industry
Process capability index
Manufacturing industries
Logic

All Science Journal Classification (ASJC) codes

  • Safety, Risk, Reliability and Quality
  • Management Science and Operations Research

Cite this

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Another look at the process capability index. / Chao, Min Te; Lin, Dennis K.J.

In: Quality and Reliability Engineering International, Vol. 22, No. 2, 01.03.2006, p. 153-163.

Research output: Contribution to journalArticle

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