Applications of capacitive array sensors to nondestructive evaluation

P. J. Shull, J. C. Moulder, P. R. Heyliger, M. Gimple, B. A. Auld

Research output: Chapter in Book/Report/Conference proceedingChapter

3 Scopus citations

Abstract

A capacitive array sensor was designed and fabricated for NDE applications and tested on both dielectrics and conductors. The response of the probe to steps and notches was characterized and the liftoff effect was studied. Buried flaws at depths greater than 4 mm were detected in dielectrics. In both insulators and conductors the probe was highly sensitive to surface features. Preliminary studies using the probe were also conducted in typical NDE applications including crack detection in glass, thickness and porosity monitoring in ceramics, and dielectric property determination during epoxy curing.

Original languageEnglish (US)
Title of host publicationReview of Progress in Quantitative Nondestructive Evaluation
Pages517-523
Number of pages7
Volume7 A
StatePublished - Dec 1 1988

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All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

Shull, P. J., Moulder, J. C., Heyliger, P. R., Gimple, M., & Auld, B. A. (1988). Applications of capacitive array sensors to nondestructive evaluation. In Review of Progress in Quantitative Nondestructive Evaluation (Vol. 7 A, pp. 517-523)