A capacitive array sensor was designed and fabricated for NDE applications and tested on both dielectrics and conductors. The response of the probe to steps and notches was characterized and the liftoff effect was studied. Buried flaws at depths greater than 4 mm were detected in dielectrics. In both insulators and conductors the probe was highly sensitive to surface features. Preliminary studies using the probe were also conducted in typical NDE applications including crack detection in glass, thickness and porosity monitoring in ceramics, and dielectric property determination during epoxy curing.
|Original language||English (US)|
|Title of host publication||Review of Progress in Quantitative Nondestructive Evaluation|
|Number of pages||7|
|State||Published - Dec 1 1988|
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