APPLICATIONS OF DYNAMIC PHOTOELASTICITY IN FLAW DETECTION ANALYSIS.

Joseph Lawrence Rose, Richard W. Mortimer, Pei Chi Chou

Research output: Contribution to specialist publicationArticle

2 Citations (Scopus)

Abstract

The purpose of this paper is to introduce an experimental procedure in wave propagation that can be used to provide insight into the development of procedures necessary for the evaluation of complex pulse-echo signals and reflection patterns from flaws of odd shape and location. Dynamic photoelasticity is used to obtain a full field view of the reflection patterns of a plane wave impinging on flaws of known shape and location in thin plates.

Original languageEnglish (US)
Pages242-247
Number of pages6
Volume30
No11
Specialist publicationMaterials Evaluation
StatePublished - Jan 1 1972

Fingerprint

Photoelasticity
Defects
Wave propagation

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Rose, J. L., Mortimer, R. W., & Chou, P. C. (1972). APPLICATIONS OF DYNAMIC PHOTOELASTICITY IN FLAW DETECTION ANALYSIS. Materials Evaluation, 30(11), 242-247.
Rose, Joseph Lawrence ; Mortimer, Richard W. ; Chou, Pei Chi. / APPLICATIONS OF DYNAMIC PHOTOELASTICITY IN FLAW DETECTION ANALYSIS. In: Materials Evaluation. 1972 ; Vol. 30, No. 11. pp. 242-247.
@misc{fd152026350a493a941c60aa29b43f86,
title = "APPLICATIONS OF DYNAMIC PHOTOELASTICITY IN FLAW DETECTION ANALYSIS.",
abstract = "The purpose of this paper is to introduce an experimental procedure in wave propagation that can be used to provide insight into the development of procedures necessary for the evaluation of complex pulse-echo signals and reflection patterns from flaws of odd shape and location. Dynamic photoelasticity is used to obtain a full field view of the reflection patterns of a plane wave impinging on flaws of known shape and location in thin plates.",
author = "Rose, {Joseph Lawrence} and Mortimer, {Richard W.} and Chou, {Pei Chi}",
year = "1972",
month = "1",
day = "1",
language = "English (US)",
volume = "30",
pages = "242--247",
journal = "Materials Evaluation",
issn = "0025-5327",
publisher = "American Society for Nondestructive Testing",

}

Rose, JL, Mortimer, RW & Chou, PC 1972, 'APPLICATIONS OF DYNAMIC PHOTOELASTICITY IN FLAW DETECTION ANALYSIS.' Materials Evaluation, vol. 30, no. 11, pp. 242-247.

APPLICATIONS OF DYNAMIC PHOTOELASTICITY IN FLAW DETECTION ANALYSIS. / Rose, Joseph Lawrence; Mortimer, Richard W.; Chou, Pei Chi.

In: Materials Evaluation, Vol. 30, No. 11, 01.01.1972, p. 242-247.

Research output: Contribution to specialist publicationArticle

TY - GEN

T1 - APPLICATIONS OF DYNAMIC PHOTOELASTICITY IN FLAW DETECTION ANALYSIS.

AU - Rose, Joseph Lawrence

AU - Mortimer, Richard W.

AU - Chou, Pei Chi

PY - 1972/1/1

Y1 - 1972/1/1

N2 - The purpose of this paper is to introduce an experimental procedure in wave propagation that can be used to provide insight into the development of procedures necessary for the evaluation of complex pulse-echo signals and reflection patterns from flaws of odd shape and location. Dynamic photoelasticity is used to obtain a full field view of the reflection patterns of a plane wave impinging on flaws of known shape and location in thin plates.

AB - The purpose of this paper is to introduce an experimental procedure in wave propagation that can be used to provide insight into the development of procedures necessary for the evaluation of complex pulse-echo signals and reflection patterns from flaws of odd shape and location. Dynamic photoelasticity is used to obtain a full field view of the reflection patterns of a plane wave impinging on flaws of known shape and location in thin plates.

UR - http://www.scopus.com/inward/record.url?scp=0015431557&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0015431557&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0015431557

VL - 30

SP - 242

EP - 247

JO - Materials Evaluation

JF - Materials Evaluation

SN - 0025-5327

ER -

Rose JL, Mortimer RW, Chou PC. APPLICATIONS OF DYNAMIC PHOTOELASTICITY IN FLAW DETECTION ANALYSIS. Materials Evaluation. 1972 Jan 1;30(11):242-247.