Applications of fullerene beams in analysis of thin layers

B. Czerwiński, L. Rzeźnik, K. Stachura, R. Paruch, B. J. Garrison, Z. Postawa

Research output: Contribution to journalArticle

10 Scopus citations

Abstract

Molecular dynamics computer simulations have been employed to model ejection of particles from Ag{1 1 1} metal substrate and thin benzene overlayer bombarded by fullerene cluster projectiles. The sputtering yields are analyzed depending on the size (from C20 up to C540) and the kinetic energy (5-20 keV) of a projectile. It has been found that for clean metal substrate bombarded by 15 keV projectiles the maximum ejection is stimulated by the impact of the C60 cluster. However, the size of the cluster projectile maximizing the yield depends on the kinetic energy of the cluster, shifting towards larger clusters as the impact energy increases. For a thin benzene overlayer, the yield increases monotonically with the size of the cluster within investigated range of fullerene projectiles and kinetic energies.

Original languageEnglish (US)
Pages (from-to)1120-1123
Number of pages4
JournalVacuum
Volume82
Issue number10
DOIs
StatePublished - Jun 3 2008

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Condensed Matter Physics
  • Surfaces, Coatings and Films

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    Czerwiński, B., Rzeźnik, L., Stachura, K., Paruch, R., Garrison, B. J., & Postawa, Z. (2008). Applications of fullerene beams in analysis of thin layers. Vacuum, 82(10), 1120-1123. https://doi.org/10.1016/j.vacuum.2008.01.042