Argon cluster ion beams for organic depth profiling: Results from a VAMAS interlaboratory study

Alexander G. Shard, Rasmus Havelund, Martin P. Seah, Steve J. Spencer, Ian S. Gilmore, Nicholas Winograd, Dan Mao, Takuya Miyayama, Ewald Niehuis, Derk Rading, Rudolf Moellers

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Chemical Compounds