Assessing the effect of stylus tip radius and flight on surface topography measurements

J. I. Mc Cool

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

The mean square height, slope, and curvature are characteristics of roughness microgeometry that govern the performance of real surfaces in elastic contact. The values of these quantities deduced from stylus profile traces are distorted by the nonlinear filtering effect of the finite stylus tip and by the failure, at high enough tracing speeds of the stylus to maintain contact with the profile being traced. This paper describes the development of a simulation model for assessing the magnitude of this distortion as well as the effect of record length and sampling frequency with tracing profiles that are realizations of a random process having a specified spectrum. Illustrative parametric runs of the model are discussed.

Original languageEnglish (US)
Pages (from-to)202-208
Number of pages7
JournalJournal of Tribology
Volume106
Issue number2
DOIs
StatePublished - Apr 1984

Fingerprint

Surface topography
topography
flight
tracing
Nonlinear filtering
radii
profiles
Random processes
random processes
Surface roughness
Sampling
roughness
sampling
curvature
slopes
simulation

All Science Journal Classification (ASJC) codes

  • Mechanics of Materials
  • Mechanical Engineering
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

Cite this

@article{8fb037873fe940f7b291277567bc10bc,
title = "Assessing the effect of stylus tip radius and flight on surface topography measurements",
abstract = "The mean square height, slope, and curvature are characteristics of roughness microgeometry that govern the performance of real surfaces in elastic contact. The values of these quantities deduced from stylus profile traces are distorted by the nonlinear filtering effect of the finite stylus tip and by the failure, at high enough tracing speeds of the stylus to maintain contact with the profile being traced. This paper describes the development of a simulation model for assessing the magnitude of this distortion as well as the effect of record length and sampling frequency with tracing profiles that are realizations of a random process having a specified spectrum. Illustrative parametric runs of the model are discussed.",
author = "{Mc Cool}, {J. I.}",
year = "1984",
month = "4",
doi = "10.1115/1.3260884",
language = "English (US)",
volume = "106",
pages = "202--208",
journal = "Journal of Tribology",
issn = "0742-4787",
publisher = "American Society of Mechanical Engineers(ASME)",
number = "2",

}

Assessing the effect of stylus tip radius and flight on surface topography measurements. / Mc Cool, J. I.

In: Journal of Tribology, Vol. 106, No. 2, 04.1984, p. 202-208.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Assessing the effect of stylus tip radius and flight on surface topography measurements

AU - Mc Cool, J. I.

PY - 1984/4

Y1 - 1984/4

N2 - The mean square height, slope, and curvature are characteristics of roughness microgeometry that govern the performance of real surfaces in elastic contact. The values of these quantities deduced from stylus profile traces are distorted by the nonlinear filtering effect of the finite stylus tip and by the failure, at high enough tracing speeds of the stylus to maintain contact with the profile being traced. This paper describes the development of a simulation model for assessing the magnitude of this distortion as well as the effect of record length and sampling frequency with tracing profiles that are realizations of a random process having a specified spectrum. Illustrative parametric runs of the model are discussed.

AB - The mean square height, slope, and curvature are characteristics of roughness microgeometry that govern the performance of real surfaces in elastic contact. The values of these quantities deduced from stylus profile traces are distorted by the nonlinear filtering effect of the finite stylus tip and by the failure, at high enough tracing speeds of the stylus to maintain contact with the profile being traced. This paper describes the development of a simulation model for assessing the magnitude of this distortion as well as the effect of record length and sampling frequency with tracing profiles that are realizations of a random process having a specified spectrum. Illustrative parametric runs of the model are discussed.

UR - http://www.scopus.com/inward/record.url?scp=0021177245&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0021177245&partnerID=8YFLogxK

U2 - 10.1115/1.3260884

DO - 10.1115/1.3260884

M3 - Article

AN - SCOPUS:0021177245

VL - 106

SP - 202

EP - 208

JO - Journal of Tribology

JF - Journal of Tribology

SN - 0742-4787

IS - 2

ER -