Astrophysical extended X-ray absorption fine-structure analysis

Jonathan W. Woo, Robert C. Forrey, Kyeongjae Cho

Research output: Contribution to journalArticle

11 Scopus citations

Abstract

We present an astrophysical extended X-ray absorption fine-structure (EXAFS) analysis (AEA) tool. The AEA tool is designed to generate a numerical model of the modification to the X-ray absorption coefficient due to the EXAFS phenomenon. We have constructed a complete database (elements up to the atomic number 92) of EXAFS parameters: central atom phase shift (2δ1), backscattering phase shift (φb), and backscattering amplitude (F). Using the EXAFS parameter data base, the AEA tool can generate a numerical model of any compound when the atomic numbers of neighboring atoms and their distances to the central X-ray-absorbing atom are given.

Original languageEnglish (US)
Pages (from-to)235-240
Number of pages6
JournalAstrophysical Journal
Volume477
Issue number1 PART I
DOIs
StatePublished - Jan 1 1997

All Science Journal Classification (ASJC) codes

  • Astronomy and Astrophysics
  • Space and Planetary Science

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