Atomic force microscopy and real atomic resolution. Simple computer simulations

V. Koutsos, Evangelos Manias, G. Ten Brinke, G. Hadziioannou

Research output: Contribution to journalArticle

19 Citations (Scopus)

Abstract

Using a simple computer simulation for AFM imaging in the contact mode, pictures with true and false atomic resolution are demonstrated. The surface probed consists of two f.c.c. (111) planes and an atomic vacancy is introduced in the upper layer. Changing the size of the effective tip and its registry with respect to the atoms of the crystal probed, images with completely different qualitative features are obtained. If the effective tip is a single atom the vacancy is clearly imaged. However, if the tip consists of several atoms and is in registry with the sample, a virtual atom appears instead of the vacancy and the crystal lattice is perfectly reproduced. If the tip is out of registry with respect to the sample, artifacts having the size of the effective tip are reported.

Original languageEnglish (US)
Pages (from-to)103-107
Number of pages5
JournalEPL
Volume26
Issue number2
DOIs
StatePublished - Apr 10 1994

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computerized simulation
atomic force microscopy
atoms
crystal lattices
artifacts
crystals

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

Koutsos, V. ; Manias, Evangelos ; Brinke, G. Ten ; Hadziioannou, G. / Atomic force microscopy and real atomic resolution. Simple computer simulations. In: EPL. 1994 ; Vol. 26, No. 2. pp. 103-107.
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Atomic force microscopy and real atomic resolution. Simple computer simulations. / Koutsos, V.; Manias, Evangelos; Brinke, G. Ten; Hadziioannou, G.

In: EPL, Vol. 26, No. 2, 10.04.1994, p. 103-107.

Research output: Contribution to journalArticle

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