Abstract
Using a simple computer simulation for AFM imaging in the contact mode, pictures with true and false atomic resolution are demonstrated. The surface probed consists of two f.c.c. (111) planes and an atomic vacancy is introduced in the upper layer. Changing the size of the effective tip and its registry with respect to the atoms of the crystal probed, images with completely different qualitative features are obtained. If the effective tip is a single atom the vacancy is clearly imaged. However, if the tip consists of several atoms and is in registry with the sample, a virtual atom appears instead of the vacancy and the crystal lattice is perfectly reproduced. If the tip is out of registry with respect to the sample, artifacts having the size of the effective tip are reported.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 103-107 |
| Number of pages | 5 |
| Journal | EPL |
| Volume | 26 |
| Issue number | 2 |
| DOIs | |
| State | Published - Apr 10 1994 |
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All Science Journal Classification (ASJC) codes
- Physics and Astronomy(all)
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Atomic force microscopy and real atomic resolution. Simple computer simulations. / Koutsos, V.; Manias, Evangelos; Brinke, G. Ten; Hadziioannou, G.
In: EPL, Vol. 26, No. 2, 10.04.1994, p. 103-107.Research output: Contribution to journal › Article
TY - JOUR
T1 - Atomic force microscopy and real atomic resolution. Simple computer simulations
AU - Koutsos, V.
AU - Manias, Evangelos
AU - Brinke, G. Ten
AU - Hadziioannou, G.
PY - 1994/4/10
Y1 - 1994/4/10
N2 - Using a simple computer simulation for AFM imaging in the contact mode, pictures with true and false atomic resolution are demonstrated. The surface probed consists of two f.c.c. (111) planes and an atomic vacancy is introduced in the upper layer. Changing the size of the effective tip and its registry with respect to the atoms of the crystal probed, images with completely different qualitative features are obtained. If the effective tip is a single atom the vacancy is clearly imaged. However, if the tip consists of several atoms and is in registry with the sample, a virtual atom appears instead of the vacancy and the crystal lattice is perfectly reproduced. If the tip is out of registry with respect to the sample, artifacts having the size of the effective tip are reported.
AB - Using a simple computer simulation for AFM imaging in the contact mode, pictures with true and false atomic resolution are demonstrated. The surface probed consists of two f.c.c. (111) planes and an atomic vacancy is introduced in the upper layer. Changing the size of the effective tip and its registry with respect to the atoms of the crystal probed, images with completely different qualitative features are obtained. If the effective tip is a single atom the vacancy is clearly imaged. However, if the tip consists of several atoms and is in registry with the sample, a virtual atom appears instead of the vacancy and the crystal lattice is perfectly reproduced. If the tip is out of registry with respect to the sample, artifacts having the size of the effective tip are reported.
UR - http://www.scopus.com/inward/record.url?scp=84957339040&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84957339040&partnerID=8YFLogxK
U2 - 10.1209/0295-5075/26/2/005
DO - 10.1209/0295-5075/26/2/005
M3 - Article
VL - 26
SP - 103
EP - 107
JO - Europhysics Letters
JF - Europhysics Letters
SN - 0295-5075
IS - 2
ER -