Atomic resolution imaging of grain boundary defects in monolayer chemical vapor deposition-grown hexagonal boron nitride

Ashley L. Gibb, Nasim Alem, Jian Hao Chen, Kristopher J. Erickson, Jim Ciston, Abhay Gautam, Martin Linck, Alex Zettl

Research output: Contribution to journalArticlepeer-review

167 Scopus citations

Abstract

Grain boundaries are observed and characterized in chemical vapor deposition-grown sheets of hexagonal boron nitride (h-BN) via ultra-high-resolution transmission electron microscopy at elevated temperature. Five- and seven-fold defects are readily observed along the grain boundary. Dynamics of strained regions and grain boundary defects are resolved. The defect structures and the resulting out-of-plane warping are consistent with recent theoretical model predictions for grain boundaries in h-BN.

Original languageEnglish (US)
Pages (from-to)6758-6761
Number of pages4
JournalJournal of the American Chemical Society
Volume135
Issue number18
DOIs
StatePublished - May 8 2013

All Science Journal Classification (ASJC) codes

  • Catalysis
  • Chemistry(all)
  • Biochemistry
  • Colloid and Surface Chemistry

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