TY - JOUR
T1 - Automated analysis of evolving interfaces during in situ electron microscopy
AU - Schneider, Nicholas M.
AU - Park, Jeung Hun
AU - Norton, Michael M.
AU - Ross, Frances M.
AU - Bau, Haim H.
N1 - Funding Information:
The nanoaquarium fabrication was carried out at the Cornell NanoScale Facility (NSF Grant ECS-0335765), a member of the National Nanotechnology Infrastructure Network. Electron microscopy was carried out at the Penn Regional Nanotechnology Facility and the IBM T. J. Watson Research Center with the valuable assistance of Dr. Joseph M. Grogan and Mr. Peter Szczesniak of UPenn and Dr. Mark C. Reuter and Mr. Arthur Ellis of IBM. Gold nanorods were generously provided by Dr. Christopher Murray. The work was supported, in part, by the National Science Foundation Grants 1129722 and 1066573 to the University of Pennsylvania, and 1310639 to the University of California Los Angeles.
Funding Information:
NMS, FMR, and HHB conceived the project and all interpreted the results and wrote the manuscript. NMS, JHP, MMN, and FMR designed and carried out the experiments. NMS implemented image processing schemes and conducted data analysis. All authors read and approved the final manuscript. The nanoaquarium fabrication was carried out at the Cornell NanoScale Facility (NSF Grant ECS-0335765), a member of the National Nanotechnology Infrastructure Network. Electron microscopy was carried out at the Penn Regional Nanotechnology Facility and the IBM T. J. Watson Research Center with the valuable assistance of Dr. Joseph M. Grogan and Mr. Peter Szczesniak of UPenn and Dr. Mark C. Reuter and Mr. Arthur Ellis of IBM. Gold nanorods were generously provided by Dr. Christopher Murray. The work was supported, in part, by the National Science Foundation Grants 1129722 and 1066573 to the University of Pennsylvania, and 1310639 to the University of California Los Angeles. The authors declare that they have no competing interests.
Publisher Copyright:
© 2016, Schneider et al.
PY - 2016/1/1
Y1 - 2016/1/1
N2 - In situ electron microscopy allows one to monitor dynamical processes at high spatial and temporal resolution. This produces large quantities of data, and hence automated image processing algorithms are needed to extract useful quantitative measures of the observed phenomena. In this work, we outline an image processing workflow for the analysis of evolving interfaces imaged during liquid cell electron microscopy. As examples, we show metal electrodeposition at electrode surfaces; beam-induced nanocrystal formation and dissolution; and beam-induced bubble nucleation, growth, and migration. These experiments are used to demonstrate a fully automated workflow for the extraction of, among other things, interface position, roughness, lateral wavelength, local normal velocity, and the projected area of the evolving phase as functions of time. The relevant algorithms have been implemented in Mathematica and are available online.
AB - In situ electron microscopy allows one to monitor dynamical processes at high spatial and temporal resolution. This produces large quantities of data, and hence automated image processing algorithms are needed to extract useful quantitative measures of the observed phenomena. In this work, we outline an image processing workflow for the analysis of evolving interfaces imaged during liquid cell electron microscopy. As examples, we show metal electrodeposition at electrode surfaces; beam-induced nanocrystal formation and dissolution; and beam-induced bubble nucleation, growth, and migration. These experiments are used to demonstrate a fully automated workflow for the extraction of, among other things, interface position, roughness, lateral wavelength, local normal velocity, and the projected area of the evolving phase as functions of time. The relevant algorithms have been implemented in Mathematica and are available online.
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U2 - 10.1186/s40679-016-0016-z
DO - 10.1186/s40679-016-0016-z
M3 - Article
AN - SCOPUS:85042125366
VL - 2
JO - Advanced Structural and Chemical Imaging
JF - Advanced Structural and Chemical Imaging
SN - 2198-0926
IS - 1
M1 - 2
ER -