Blue phosphorescent organic light emitting device stability analysis

Brian W. D'Andrade, Michael S. Weaver, Peter B. Mackenzie, Hitoshi Yamamoto, Julie J. Brown, Noel C. Giebink, Stephen R. Forrest, Mark E. Thompson

Research output: Contribution to journalConference article

5 Scopus citations

Abstract

A model based on defect generation by exciton-polaron annihilation interactions between the emitter and host molecules, in a blue phosphorescent OLED, is shown to fit well with experimental data. A blue PHOLED with (0.15, 0.25) chromaticity is shown to have a halflife, from 1,000 nits, of 690 hrs.

Original languageEnglish (US)
Pages (from-to)712-715
Number of pages4
JournalDigest of Technical Papers - SID International Symposium
Volume39
Issue number1
DOIs
StatePublished - 2008
Event2008 SID International Symposium - Los Angeles, CA, United States
Duration: May 20 2008May 21 2008

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Fingerprint Dive into the research topics of 'Blue phosphorescent organic light emitting device stability analysis'. Together they form a unique fingerprint.

  • Cite this

    D'Andrade, B. W., Weaver, M. S., Mackenzie, P. B., Yamamoto, H., Brown, J. J., Giebink, N. C., Forrest, S. R., & Thompson, M. E. (2008). Blue phosphorescent organic light emitting device stability analysis. Digest of Technical Papers - SID International Symposium, 39(1), 712-715. https://doi.org/10.1889/1.3069766