Boosting phase contrast with a grating BonseHart interferometer of 200 nanometre grating period

Han Wen, Andrew A. Gomella, Ajay Patel, Douglas E. Wolfe, Susanna K. Lynch, Xianghui Xiao, Nicole Morgan

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

We report on a grating BonseHart interferometer for phase-contrast imaging with hard X-rays. Themethod overcomes limitations in the level of sensitivity that can be achieved with the well-known Talbot grating interferometer, and without the stringent spectral filtering at any given incident angle imposed by the classic BonseHart interferometer. The device operates in the far-field regime, where an incident beam is split by a diffraction grating into two widely separated beams, which are redirected by a second diffraction grating to merge at a third grating, where they coherently interfere. The wide separation of the interfering beams results in large phase contrast, and in some cases absolute phase images are obtained. Imaging experiments were performed using diffraction gratings of 200nm period, at 22.5 keV and 1.5% spectral bandwidth on a bending-magnetic beamline. Novel design and fabrication process were used to achieve the small grating period. Using a slitted incident beam, we acquired absolute and differential phase images of lightly absorbing samples. An advantage of this method is that it uses only phase modulating gratings, which are easier to fabricate than absorption gratings of the same periods.

Original languageEnglish (US)
JournalPhilosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences
Volume372
Issue number2010
DOIs
StatePublished - Mar 6 2014

Fingerprint

Phase Contrast
Diffraction gratings
phase contrast
Boosting
Interferometer
Interferometers
Gratings
interferometers
gratings
Diffraction Grating
gratings (spectra)
Imaging techniques
Imaging
Hard X-ray
Far Field
Bandwidth
Absorbing
Fabrication
X rays
far fields

All Science Journal Classification (ASJC) codes

  • Mathematics(all)
  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

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title = "Boosting phase contrast with a grating BonseHart interferometer of 200 nanometre grating period",
abstract = "We report on a grating BonseHart interferometer for phase-contrast imaging with hard X-rays. Themethod overcomes limitations in the level of sensitivity that can be achieved with the well-known Talbot grating interferometer, and without the stringent spectral filtering at any given incident angle imposed by the classic BonseHart interferometer. The device operates in the far-field regime, where an incident beam is split by a diffraction grating into two widely separated beams, which are redirected by a second diffraction grating to merge at a third grating, where they coherently interfere. The wide separation of the interfering beams results in large phase contrast, and in some cases absolute phase images are obtained. Imaging experiments were performed using diffraction gratings of 200nm period, at 22.5 keV and 1.5{\%} spectral bandwidth on a bending-magnetic beamline. Novel design and fabrication process were used to achieve the small grating period. Using a slitted incident beam, we acquired absolute and differential phase images of lightly absorbing samples. An advantage of this method is that it uses only phase modulating gratings, which are easier to fabricate than absorption gratings of the same periods.",
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Boosting phase contrast with a grating BonseHart interferometer of 200 nanometre grating period. / Wen, Han; Gomella, Andrew A.; Patel, Ajay; Wolfe, Douglas E.; Lynch, Susanna K.; Xiao, Xianghui; Morgan, Nicole.

In: Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences, Vol. 372, No. 2010, 06.03.2014.

Research output: Contribution to journalArticle

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AU - Xiao, Xianghui

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