C-TESTABILITY OF UNILATERAL AND BILATERAL SEQUENTIAL ARRAYS.

Shishpal Rawat, Mary Jane Irwin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations

Abstract

C-testability of systolic arrays with memory is studied for one-dimensional sequential arrays. C-testability implies that the number of test vectors is independent of the size of the array. Algorithms to verify the functionality of the array are described. It is proved that a constant number of test vectors will suffice to test the entire modified array. Hardware modifications needed to make the sequential array C-testable are described.

Original languageEnglish (US)
Title of host publicationDigest of Papers - International Test Conference
PublisherIEEE
Pages181-188
Number of pages8
ISBN (Print)081860798X
Publication statusPublished - Dec 1 1987
EventDig Pap Int Test Conf 1987, Proc, Integr of Test with Des and Manuf - Washington, DC, USA
Duration: Sep 1 1987Sep 3 1987

Publication series

NameDigest of Papers - International Test Conference
ISSN (Print)0743-1686

Other

OtherDig Pap Int Test Conf 1987, Proc, Integr of Test with Des and Manuf
CityWashington, DC, USA
Period9/1/879/3/87

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All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

Rawat, S., & Irwin, M. J. (1987). C-TESTABILITY OF UNILATERAL AND BILATERAL SEQUENTIAL ARRAYS. In Digest of Papers - International Test Conference (pp. 181-188). (Digest of Papers - International Test Conference). IEEE.