C-TESTABILITY OF UNILATERAL AND BILATERAL SEQUENTIAL ARRAYS.

Shishpal Rawat, Mary Jane Irwin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

C-testability of systolic arrays with memory is studied for one-dimensional sequential arrays. C-testability implies that the number of test vectors is independent of the size of the array. Algorithms to verify the functionality of the array are described. It is proved that a constant number of test vectors will suffice to test the entire modified array. Hardware modifications needed to make the sequential array C-testable are described.

Original languageEnglish (US)
Title of host publicationDigest of Papers - International Test Conference
PublisherIEEE
Pages181-188
Number of pages8
ISBN (Print)081860798X
StatePublished - Dec 1 1987
EventDig Pap Int Test Conf 1987, Proc, Integr of Test with Des and Manuf - Washington, DC, USA
Duration: Sep 1 1987Sep 3 1987

Other

OtherDig Pap Int Test Conf 1987, Proc, Integr of Test with Des and Manuf
CityWashington, DC, USA
Period9/1/879/3/87

Fingerprint

Systolic arrays
Hardware
Data storage equipment

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

Rawat, S., & Irwin, M. J. (1987). C-TESTABILITY OF UNILATERAL AND BILATERAL SEQUENTIAL ARRAYS. In Digest of Papers - International Test Conference (pp. 181-188). IEEE.
Rawat, Shishpal ; Irwin, Mary Jane. / C-TESTABILITY OF UNILATERAL AND BILATERAL SEQUENTIAL ARRAYS. Digest of Papers - International Test Conference. IEEE, 1987. pp. 181-188
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Rawat, S & Irwin, MJ 1987, C-TESTABILITY OF UNILATERAL AND BILATERAL SEQUENTIAL ARRAYS. in Digest of Papers - International Test Conference. IEEE, pp. 181-188, Dig Pap Int Test Conf 1987, Proc, Integr of Test with Des and Manuf, Washington, DC, USA, 9/1/87.

C-TESTABILITY OF UNILATERAL AND BILATERAL SEQUENTIAL ARRAYS. / Rawat, Shishpal; Irwin, Mary Jane.

Digest of Papers - International Test Conference. IEEE, 1987. p. 181-188.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Rawat S, Irwin MJ. C-TESTABILITY OF UNILATERAL AND BILATERAL SEQUENTIAL ARRAYS. In Digest of Papers - International Test Conference. IEEE. 1987. p. 181-188