CH027

Y. Han, I. M. Reaney, R. Johnson, M. B. Telli, D. S. Tinberg, I. Levin, S. Trolier-McKinstry

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Epitaxial AgTa0.5Nb0.5O3 (ATN) films deposited on (001)p SrRuO3/LaAlO3 and LaAlO3 by a chemical solution deposition technique have been characterised by transmission electron microscopy. The structure of the ATN layers has been compared with equivalent bulk ceramics. For thin ATN films, only superstructure reflections at 1/2{ooo} positions were observed, consistent with a structure tilted in antiphase only. In contrast, bulk ATN showed ±1/4(001) reflections which result from a combination of in-phase and antiphase tilting along the c axis as well as antiparallel cation displacements.

Original languageEnglish (US)
Title of host publication17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008
DOIs
StatePublished - 2008
Event17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008 - Santa Fe, NM, United States
Duration: Feb 23 2008Feb 28 2008

Publication series

NameIEEE International Symposium on Applications of Ferroelectrics
Volume1

Other

Other17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008
CountryUnited States
CitySanta Fe, NM
Period2/23/082/28/08

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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  • Cite this

    Han, Y., Reaney, I. M., Johnson, R., Telli, M. B., Tinberg, D. S., Levin, I., & Trolier-McKinstry, S. (2008). CH027. In 17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008 [4693931] (IEEE International Symposium on Applications of Ferroelectrics; Vol. 1). https://doi.org/10.1109/ISAF.2008.4693931