@inbook{27bab24aeffc4fe7b0c7a9aa75c766e6,
title = "Chapter 7 Novel Aberration Correction Concepts",
abstract = "The new concept for improving spatial resolution for in situ experiments in TEM mode based on Cs correction and monochromatization is presented. The loss in resolution caused by a wide-gap objective lens for this case can be compensated by a smaller energy width of the electron beam. Cc correction can also affect the damping envelope of temporal coherence. A larger fraction of the emitted electrons can be used for a Cc-corrected system compared with a TEM with electron beam monochromatization and Cs correction. This property can also be used for shorter exposure times or higher SNR. The advantage of Cc correction includes the coefficient of chromatic aberration can be reduced by a much greater amount. It also make no-impact on the brightness of the electron source and the electron beam current, which subsequently allows a high SNR.",
author = "Bernd Kabius and Harald Rose",
note = "Funding Information: The authors thank Max Haider, Stefan Uhlemann, and Heiko Mueller for valuable discussions. This work was conducted as part of the TEAM project, a multilaboratory collaborative effort funded by the Department of Energy, Office of Science, Basic Energy Sciences.",
year = "2008",
doi = "10.1016/S1076-5670(08)01007-0",
language = "English (US)",
isbn = "9780123742209",
series = "Advances in Imaging and Electron Physics",
publisher = "Academic Press Inc.",
pages = "261--281",
booktitle = "Advances in IMAGING AND ELECTRON PHYSICS Aberration-Corrected Electron Microscopy",
address = "United States",
}