Characterization of an x-ray hybrid CMOS detector with low interpixel capacitive crosstalk

Christopher V. Griffith, Stephen D. Bongiorno, David N. Burrows, Abraham D. Falcone, Zachary R. Prieskorn

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Scopus citations

Abstract

We present the results of x-ray measurements on a hybrid CMOS detector that uses a H2RG ROIC and a unique bonding structure. The silicon absorber array has a 36μm pixel size, and the readout array has a pitch of 18μm; but only one readout circuit line is bonded to each 36×36μm absorber pixel. This unique bonding structure gives the readout an effective pitch of 36μm. We find the increased pitch between readout bonds significantly reduces the interpixel capacitance of the CMOS detector reported by Bongiorno et al. 20101 and Kenter et al. 2005.2

Original languageEnglish (US)
Title of host publicationHigh Energy, Optical, and Infrared Detectors for Astronomy V
DOIs
Publication statusPublished - Dec 1 2012
EventHigh Energy, Optical, and Infrared Detectors for Astronomy V - Amsterdam, Netherlands
Duration: Jul 1 2012Jul 4 2012

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8453
ISSN (Print)0277-786X

Other

OtherHigh Energy, Optical, and Infrared Detectors for Astronomy V
CountryNetherlands
CityAmsterdam
Period7/1/127/4/12

    Fingerprint

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Griffith, C. V., Bongiorno, S. D., Burrows, D. N., Falcone, A. D., & Prieskorn, Z. R. (2012). Characterization of an x-ray hybrid CMOS detector with low interpixel capacitive crosstalk. In High Energy, Optical, and Infrared Detectors for Astronomy V [84530F] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8453). https://doi.org/10.1117/12.925732