Characterization of ferroelectric property of c-axis- and non-c-axis-oriented epitaxially grown Bi₂VO_5.5 thin films

Engineering & Materials Science

• Ferroelectric materials 100%
• Thin films 71%
• Ferroelectricity 16%
• Electric field measurement 13%
• Metallorganic chemical vapor deposition 13%
• Remanence 12%
• Epitaxial films 12%
• Substrates 11%
• Microscopic examination 9%
• Leakage currents 9%
• Electric properties 8%
• Permittivity 8%
• Current density 8%
• Polarization 7%
• Scanning 6%

Physics & Astronomy

• characterization 42%
• thin films 38%
• ferroelectricity 8%
• polarization 8%
• metalorganic chemical vapor deposition 7%
• leakage 6%
• electrical properties 5%
• current density 5%
• microscopy 5%
• permittivity 5%
• scanning 4%
• electric fields 4%