Characterization of ordered mesoporous silica films using small-angle neutron scattering and X-ray porosimetry

Bryan D. Vogt, Rajaram A. Pai, Hae Jeong Lee, Ronald C. Hedden, Christopher L. Soles, Wen Li Wu, Eric K. Lin, Barry J. Bauer, James J. Watkins

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Engineering & Materials Science

Chemical Compounds