Characterization of the mesoscopic structure in the photoactive layer of organic solar cells

A focused review

Kiarash Vakhshouri, Sameer Vajjala Kesava, Derek R. Kozub, Enrique Daniel Gomez

Research output: Contribution to journalArticle

41 Citations (Scopus)

Abstract

Organic photovoltaics (OPVs) belong to a class of devices where the nanometer scale morphology of the active layer has a large impact on device performance. However, characterization of the morphology of organic semiconductor mixtures that make up the active layer of OPVs remains a challenge. Here, the characterization methods that can be used to quantitatively and qualitatively measure the mesoscopic structure of the active layer in organic solar cells are described. Specifically, we focus on the use of X-ray and neutron scattering, scanning probe microscopy, and electron and X-ray microscopy for morphological characterization of organic semiconductor mixtures at mesoscopic length scales.

Original languageEnglish (US)
Pages (from-to)97-102
Number of pages6
JournalMaterials Letters
Volume90
DOIs
StatePublished - Jan 1 2013

Fingerprint

Semiconducting organic compounds
solar cells
organic semiconductors
microscopy
Scanning probe microscopy
Neutron scattering
X ray scattering
Microscopic examination
neutron scattering
x rays
X rays
scanning
Electrons
probes
scattering
Organic solar cells
electrons

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

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abstract = "Organic photovoltaics (OPVs) belong to a class of devices where the nanometer scale morphology of the active layer has a large impact on device performance. However, characterization of the morphology of organic semiconductor mixtures that make up the active layer of OPVs remains a challenge. Here, the characterization methods that can be used to quantitatively and qualitatively measure the mesoscopic structure of the active layer in organic solar cells are described. Specifically, we focus on the use of X-ray and neutron scattering, scanning probe microscopy, and electron and X-ray microscopy for morphological characterization of organic semiconductor mixtures at mesoscopic length scales.",
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Characterization of the mesoscopic structure in the photoactive layer of organic solar cells : A focused review. / Vakhshouri, Kiarash; Kesava, Sameer Vajjala; Kozub, Derek R.; Gomez, Enrique Daniel.

In: Materials Letters, Vol. 90, 01.01.2013, p. 97-102.

Research output: Contribution to journalArticle

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