The use of imaging time-of-flight secondary ion mass spectrometry (TOF-SIMS) is being explored as a means to characterize the lateral distribution of molecules on glass surfaces. This article details the basic elements of TOF-SIMS instrumentation. It also illustrates the power of the approach via examination of the mass spectra of coated and uncoated glass fibers.
|Original language||English (US)|
|Number of pages||2|
|State||Published - 1999|
All Science Journal Classification (ASJC) codes
- Chemical Engineering(all)