Chemical solution deposited silver tantalate niobate, Ag x (Ta0.5Nb0.5)O3-y , thin films on (111)Pt/Ti/SiO2/(100)Si substrates

Mustafa Burak Telli; Susan Trolier-Mckinstry; David Ian Woodward; Ian Michael Reaney

doi:10.1007/s10971-006-0204-8

Chemical solution deposited silver tantalate niobate, Ag _x (Ta_0.5Nb_0.5)O_3-y , thin films on (111)Pt/Ti/SiO₂/(100)Si substrates

Mustafa Burak Telli, Susan Trolier-Mckinstry, David Ian Woodward, Ian Michael Reaney

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

Abstract

Silver tantalate niobate films are candidates for temperature stable microwave dielectrics. In this work, a chemical solution deposition synthesis method was developed for Ag _x (Ta_0.5Nb_0.5) O_3-y films on Pt-coated Si substrates. Stable solutions with a range of silver stoichiometries were prepared using 2-methoxyethanol and pyridine as solvents, from AgNO₃ and Nb and Ta ethoxide precursors. It was extremely difficult to prepare phase-pure perovskite films of Ag(Ta _0.5Nb_0.5)O₃ on Pt-coated Si subtrates; instead a mixture of perovskite and natrotantite phases was identified. Such mixed phase films had dielectric constant _r and dielectric loss tanδ values ranging from 200±20 to 270±25 and 0.006±0.002 to 0.002±0.001 at 100kHz, respectively, depending on the firing temperature. For Ag₂(Ta_0.5Nb_0.5)₄O₁₁, Ag_0.8(Ta_0.5Nb_0.5)O_2.9, Ag _0.85(Ta_0.5Nb_0.5)O_2.925 and Ag _0.9(Ta_0.5Nb_0.5)O_2.95 films, mainly the natrotantite phase was observed. The _r values of these films were between 70±10 and 130±15 with tan δ values of 0.008±0.002 at 100 kHz.

Original language	English (US)
Pages (from-to)	407-414
Number of pages	8
Journal	Journal of Sol-Gel Science and Technology
Volume	42
Issue number	3
DOIs	https://doi.org/10.1007/s10971-006-0204-8
State	Published - Jun 1 2007

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Ceramics and Composites
Chemistry(all)
Biomaterials
Condensed Matter Physics
Materials Chemistry

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@article{edf2be7fedb243cf9c9decca2a20da9c,

title = "Chemical solution deposited silver tantalate niobate, Ag x (Ta0.5Nb0.5)O3-y , thin films on (111)Pt/Ti/SiO2/(100)Si substrates",

abstract = "Silver tantalate niobate films are candidates for temperature stable microwave dielectrics. In this work, a chemical solution deposition synthesis method was developed for Ag x (Ta0.5Nb0.5) O3-y films on Pt-coated Si substrates. Stable solutions with a range of silver stoichiometries were prepared using 2-methoxyethanol and pyridine as solvents, from AgNO3 and Nb and Ta ethoxide precursors. It was extremely difficult to prepare phase-pure perovskite films of Ag(Ta 0.5Nb0.5)O3 on Pt-coated Si subtrates; instead a mixture of perovskite and natrotantite phases was identified. Such mixed phase films had dielectric constant r and dielectric loss tanδ values ranging from 200±20 to 270±25 and 0.006±0.002 to 0.002±0.001 at 100kHz, respectively, depending on the firing temperature. For Ag2(Ta0.5Nb0.5)4O11, Ag0.8(Ta0.5Nb0.5)O2.9, Ag 0.85(Ta0.5Nb0.5)O2.925 and Ag 0.9(Ta0.5Nb0.5)O2.95 films, mainly the natrotantite phase was observed. The r values of these films were between 70±10 and 130±15 with tan δ values of 0.008±0.002 at 100 kHz.",

author = "Telli, {Mustafa Burak} and Susan Trolier-Mckinstry and Woodward, {David Ian} and Reaney, {Ian Michael}",

year = "2007",

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doi = "10.1007/s10971-006-0204-8",

language = "English (US)",

volume = "42",

pages = "407--414",

journal = "Journal of Sol-Gel Science and Technology",

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Chemical solution deposited silver tantalate niobate, Ag _x (Ta_0.5Nb_0.5)O_3-y , thin films on (111)Pt/Ti/SiO₂/(100)Si substrates. / Telli, Mustafa Burak; Trolier-Mckinstry, Susan; Woodward, David Ian; Reaney, Ian Michael.

In: Journal of Sol-Gel Science and Technology, Vol. 42, No. 3, 01.06.2007, p. 407-414.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Chemical solution deposited silver tantalate niobate, Ag x (Ta0.5Nb0.5)O3-y , thin films on (111)Pt/Ti/SiO2/(100)Si substrates

AU - Telli, Mustafa Burak

AU - Trolier-Mckinstry, Susan

AU - Woodward, David Ian

AU - Reaney, Ian Michael

PY - 2007/6/1

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N2 - Silver tantalate niobate films are candidates for temperature stable microwave dielectrics. In this work, a chemical solution deposition synthesis method was developed for Ag x (Ta0.5Nb0.5) O3-y films on Pt-coated Si substrates. Stable solutions with a range of silver stoichiometries were prepared using 2-methoxyethanol and pyridine as solvents, from AgNO3 and Nb and Ta ethoxide precursors. It was extremely difficult to prepare phase-pure perovskite films of Ag(Ta 0.5Nb0.5)O3 on Pt-coated Si subtrates; instead a mixture of perovskite and natrotantite phases was identified. Such mixed phase films had dielectric constant r and dielectric loss tanδ values ranging from 200±20 to 270±25 and 0.006±0.002 to 0.002±0.001 at 100kHz, respectively, depending on the firing temperature. For Ag2(Ta0.5Nb0.5)4O11, Ag0.8(Ta0.5Nb0.5)O2.9, Ag 0.85(Ta0.5Nb0.5)O2.925 and Ag 0.9(Ta0.5Nb0.5)O2.95 films, mainly the natrotantite phase was observed. The r values of these films were between 70±10 and 130±15 with tan δ values of 0.008±0.002 at 100 kHz.

AB - Silver tantalate niobate films are candidates for temperature stable microwave dielectrics. In this work, a chemical solution deposition synthesis method was developed for Ag x (Ta0.5Nb0.5) O3-y films on Pt-coated Si substrates. Stable solutions with a range of silver stoichiometries were prepared using 2-methoxyethanol and pyridine as solvents, from AgNO3 and Nb and Ta ethoxide precursors. It was extremely difficult to prepare phase-pure perovskite films of Ag(Ta 0.5Nb0.5)O3 on Pt-coated Si subtrates; instead a mixture of perovskite and natrotantite phases was identified. Such mixed phase films had dielectric constant r and dielectric loss tanδ values ranging from 200±20 to 270±25 and 0.006±0.002 to 0.002±0.001 at 100kHz, respectively, depending on the firing temperature. For Ag2(Ta0.5Nb0.5)4O11, Ag0.8(Ta0.5Nb0.5)O2.9, Ag 0.85(Ta0.5Nb0.5)O2.925 and Ag 0.9(Ta0.5Nb0.5)O2.95 films, mainly the natrotantite phase was observed. The r values of these films were between 70±10 and 130±15 with tan δ values of 0.008±0.002 at 100 kHz.

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