Cluster TOF-SIMS Imaging and the Characterization of Biological Materials

John Vickerman, Nick Winograd

Research output: Chapter in Book/Report/Conference proceedingChapter

12 Scopus citations

Abstract

This chapter seeks to provide a brief overview of the present capabilities and the future possibilities of time-of-flight secondary ion mass spectrometry (ToF-SIMS) using cluster primary ions in the study of biological cells and tissue. There are basically two types of ToF-SIMS instrumentation available at present. By far, the majority of instruments utilize a pulsed primary beam and a reflectron time of flight mass spectrometer. Very recently a new concept of instrument has appeared that uses a DC primary beam and a hybrid two-stage mass spectrometer arrangement. First, the chapter summarizes the benefits common to both instruments and then outlines those specific to the new ToF-SIMS platforms. The challenges facing ToF-SIMS in biological studies is then discussed, followed by some illustrative examples of the present status of ToF-SIMS in biological analyses.

Original languageEnglish (US)
Title of host publicationCluster Secondary Ion Mass Spectrometry
Subtitle of host publicationPrinciples and Applications
PublisherJohn Wiley and Sons
Pages269-312
Number of pages44
ISBN (Print)9780470886052
DOIs
StatePublished - Apr 15 2013

All Science Journal Classification (ASJC) codes

  • Chemistry(all)

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    Vickerman, J., & Winograd, N. (2013). Cluster TOF-SIMS Imaging and the Characterization of Biological Materials. In Cluster Secondary Ion Mass Spectrometry: Principles and Applications (pp. 269-312). John Wiley and Sons. https://doi.org/10.1002/9781118589335.ch8