Cluster TOF-SIMS Imaging and the Characterization of Biological Materials

John Vickerman, Nick Winograd

Research output: Chapter in Book/Report/Conference proceedingChapter

14 Scopus citations


This chapter seeks to provide a brief overview of the present capabilities and the future possibilities of time-of-flight secondary ion mass spectrometry (ToF-SIMS) using cluster primary ions in the study of biological cells and tissue. There are basically two types of ToF-SIMS instrumentation available at present. By far, the majority of instruments utilize a pulsed primary beam and a reflectron time of flight mass spectrometer. Very recently a new concept of instrument has appeared that uses a DC primary beam and a hybrid two-stage mass spectrometer arrangement. First, the chapter summarizes the benefits common to both instruments and then outlines those specific to the new ToF-SIMS platforms. The challenges facing ToF-SIMS in biological studies is then discussed, followed by some illustrative examples of the present status of ToF-SIMS in biological analyses.

Original languageEnglish (US)
Title of host publicationCluster Secondary Ion Mass Spectrometry
Subtitle of host publicationPrinciples and Applications
PublisherJohn Wiley and Sons
Number of pages44
ISBN (Print)9780470886052
StatePublished - Apr 15 2013

All Science Journal Classification (ASJC) codes

  • Chemistry(all)


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