Combining FDTD simulations with measurements of microstrip ring resonators for characterization of low- and high-k dielectrics at microwaves

Elena Semouchklna, Wenwu Cao, Michael Lanagan, Raj Mittra, Wenhua Yu

Research output: Contribution to journalArticle

9 Scopus citations


This paper shows how the dielectric constant of alumina and rutile substrates at microwave frequencies can be accurately determined by fitting the simulated S-parameter spectra of microstrip ring resonators, generated via the finite-difference time-domain (FDTD) method, to experimentally measured data. The proposed method does not require the determination of the effective dielectric constant and the approximate closed-form expressions to find the true permittivity of the substrate. This is essential for the characterization of high-K dielectric materials at high frequencies when the closed-form expressions are invalid.

Original languageEnglish (US)
Pages (from-to)21-24
Number of pages4
JournalMicrowave and Optical Technology Letters
Issue number1
Publication statusPublished - Apr 5 2001


All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this