Comparison of reversal and multiprobe error separation

E. R. Marsh, D. A. Arneson, D. L. Martin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper presents a comparison of two well-known methods for separating spindle error motion from artifact roundness. This work is significant because it documents an effort to characterize a particular spindle design with less than five nanometers radial error, a figure so small that extensive verification is warranted. To this end, two distinct types of error separation methods, reversal and multiprobe, were applied using two different sets of test hardware allowing direct comparison of results using the four combinations of hardware and separation algorithm. The results show that sub-nanometer features in both spindle error and artifact form are reliably and repeatably resolved by both techniques.

Original languageEnglish (US)
Title of host publicationProceedings of the 10th Anniversary International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2008
EditorsHendrik Van Brussel, H. Spaan, E. Brinksmeier, T. Burke
Publishereuspen
Pages389-393
Number of pages5
ISBN (Electronic)9780955308253
StatePublished - Jan 1 2008
Event10th Anniversary International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2008 - Zurich, Switzerland
Duration: May 18 2008May 22 2008

Publication series

NameProceedings of the 10th Anniversary International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2008
Volume1

Other

Other10th Anniversary International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2008
CountrySwitzerland
CityZurich
Period5/18/085/22/08

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Mechanical Engineering
  • Materials Science(all)
  • Environmental Engineering
  • Industrial and Manufacturing Engineering

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  • Cite this

    Marsh, E. R., Arneson, D. A., & Martin, D. L. (2008). Comparison of reversal and multiprobe error separation. In H. Van Brussel, H. Spaan, E. Brinksmeier, & T. Burke (Eds.), Proceedings of the 10th Anniversary International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2008 (pp. 389-393). (Proceedings of the 10th Anniversary International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2008; Vol. 1). euspen.