Abstract
This work demonstrates the state of the art capabilities of three error separation techniques for nanometer-level measurement of precision spindles and rotationally-symmetric artifacts. Donaldson reversal is compared to a multi-probe and a multi-step technique using a series of measurements carried out on a precision aerostatic spindle with a lapped spherical artifact. The results indicate that sub-nanometer features in both spindle error motion and artifact form are reliably resolved by all three techniques.
| Original language | English (US) |
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| Title of host publication | Proceedings of the 20th Annual ASPE Meeting, ASPE 2005 |
| State | Published - 2005 |
| Event | 20th Annual Meeting of the American Society for Precision Engineering, ASPE 2005 - Norfolk, VA, United States Duration: Oct 9 2005 → Oct 14 2005 |
Other
| Other | 20th Annual Meeting of the American Society for Precision Engineering, ASPE 2005 |
|---|---|
| Country/Territory | United States |
| City | Norfolk, VA |
| Period | 10/9/05 → 10/14/05 |
All Science Journal Classification (ASJC) codes
- Mechanical Engineering