Compiler-directed selective data protection against soft errors

G. Chen, M. Kandemir, M. J. Irwin, G. Memik

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Scopus citations

Abstract

Soft errors in electronic devices are a growing concern for many embedded systems from diverse domains. Chip vendors are already working with system customers on ways to guard against the effects of soft errors. While error code based protection mechanisms for memories such as ECC are important, indiscriminately applying them to all data can have serious memory space and energy overheads. This paper demonstrates how an optimizing compiler can be useful in deciding which data elements need to be protected based on user-specified annotations. The proposed idea makes use of a variant of forward slicing.

Original languageEnglish (US)
Title of host publicationProceedings of the 2005 Asia and South Pacific Design Automation Conference, ASP-DAC 2005
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages713-716
Number of pages4
ISBN (Print)0780387368, 9780780387362
DOIs
StatePublished - Jan 1 2005
Event2005 Asia and South Pacific Design Automation Conference, ASP-DAC 2005 - Shanghai, China
Duration: Jan 18 2005Jan 21 2005

Publication series

NameProceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
Volume2

Other

Other2005 Asia and South Pacific Design Automation Conference, ASP-DAC 2005
CountryChina
CityShanghai
Period1/18/051/21/05

All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering

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    Chen, G., Kandemir, M., Irwin, M. J., & Memik, G. (2005). Compiler-directed selective data protection against soft errors. In Proceedings of the 2005 Asia and South Pacific Design Automation Conference, ASP-DAC 2005 (pp. 713-716). [1466436] (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC; Vol. 2). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1145/1120725.1121000