Complex piezoelectric coefficients of PZT ceramics: Method for direct measurement of d33

T. L. Jordan, Zoubeida Ounaies, T. L. Turner

Research output: Contribution to journalConference article

4 Citations (Scopus)

Abstract

A fiber-optic device is used to determine the magnitude and phase of the strain in the poling direction of lead zirconate titanate (PZT) ceramic wafers. This information yields the real and imaginary components of the piezoelectric strain coefficient d33. The measurement hardware and software are described and results from the measurements of d33 for PZT 4 and 5 H wafers are presented. This method has the advantages of being direct, inexpensive and relatively simple to use. Verification of the results is provided through the use of the resonance method.

Original languageEnglish (US)
Pages (from-to)231-236
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
Volume459
StatePublished - Jan 1 1997

Fingerprint

wafers
ceramics
coefficients
Fiber optics
fiber optics
hardware
computer programs
Hardware
Direction compound
lead titanate zirconate

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

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Complex piezoelectric coefficients of PZT ceramics : Method for direct measurement of d33. / Jordan, T. L.; Ounaies, Zoubeida; Turner, T. L.

In: Materials Research Society Symposium - Proceedings, Vol. 459, 01.01.1997, p. 231-236.

Research output: Contribution to journalConference article

TY - JOUR

T1 - Complex piezoelectric coefficients of PZT ceramics

T2 - Method for direct measurement of d33

AU - Jordan, T. L.

AU - Ounaies, Zoubeida

AU - Turner, T. L.

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Y1 - 1997/1/1

N2 - A fiber-optic device is used to determine the magnitude and phase of the strain in the poling direction of lead zirconate titanate (PZT) ceramic wafers. This information yields the real and imaginary components of the piezoelectric strain coefficient d33. The measurement hardware and software are described and results from the measurements of d33 for PZT 4 and 5 H wafers are presented. This method has the advantages of being direct, inexpensive and relatively simple to use. Verification of the results is provided through the use of the resonance method.

AB - A fiber-optic device is used to determine the magnitude and phase of the strain in the poling direction of lead zirconate titanate (PZT) ceramic wafers. This information yields the real and imaginary components of the piezoelectric strain coefficient d33. The measurement hardware and software are described and results from the measurements of d33 for PZT 4 and 5 H wafers are presented. This method has the advantages of being direct, inexpensive and relatively simple to use. Verification of the results is provided through the use of the resonance method.

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