Comprehensive S/TEM Study of Interfaces in CVD Grown Vertical and In-plane Heterostructures of Two-Dimensional MoS2and ReS2

Saiphaneendra Bachu, Lauren Stanton, Chenhao Qian, Danielle Reifsnyder Hickey, Nasim Alem

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Article number639
JournalMicroscopy and Microanalysis
DOIs
StateAccepted/In press - 2020

All Science Journal Classification (ASJC) codes

  • Instrumentation

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