Computing with ferroelectric FETs: Devices, models, systems, and applications

Ahmedullah Aziz, Evelyn T. Breyer, An Chen, Xiaoming Chen, Suman Datta, Sumeet Kumar Gupta, Michael Hoffmann, Xiaobo Sharon Hu, Adrian Ionescu, Matthew Jerry, Thomas Mikolajick, Halid Mulaosmanovic, Kai Ni, Michael Niemier, Ian O'Connor, Atanu Saha, Stefan Slesazeck, Sandeep Krishna Thirumala, Xunzhao Yin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

29 Scopus citations

Abstract

In this paper, we consider devices, circuits, and systems comprised of transistors with integrated ferroelectrics. Said structures are actively being considered by various semiconductor manufacturers as they can address a large and unique design space. Transistors with integrated ferroelectrics could (i) enable a better switch (i.e., offer steeper subthreshold swings), (ii) are CMOS compatible, (iii) have multiple operating modes (i.e., I-V characteristics can also enable compact, 1-transistor, non-volatile storage elements, as well as analog synaptic behavior), and (iv) have been experimentally demonstrated (i.e., with respect to all of the aforementioned operating modes). These device-level characteristics offer unique opportunities at the circuit, architectural, and system-level, and are considered here from device, circuit/architecture, and foundry-level perspectives.

Original languageEnglish (US)
Title of host publicationProceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1289-1298
Number of pages10
ISBN (Electronic)9783981926316
DOIs
StatePublished - Apr 19 2018
Event2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018 - Dresden, Germany
Duration: Mar 19 2018Mar 23 2018

Publication series

NameProceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018
Volume2018-January

Other

Other2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018
CountryGermany
CityDresden
Period3/19/183/23/18

All Science Journal Classification (ASJC) codes

  • Safety, Risk, Reliability and Quality
  • Hardware and Architecture
  • Software
  • Information Systems and Management

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  • Cite this

    Aziz, A., Breyer, E. T., Chen, A., Chen, X., Datta, S., Gupta, S. K., Hoffmann, M., Hu, X. S., Ionescu, A., Jerry, M., Mikolajick, T., Mulaosmanovic, H., Ni, K., Niemier, M., O'Connor, I., Saha, A., Slesazeck, S., Thirumala, S. K., & Yin, X. (2018). Computing with ferroelectric FETs: Devices, models, systems, and applications. In Proceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018 (pp. 1289-1298). (Proceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018; Vol. 2018-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.23919/DATE.2018.8342213