Confocal photoluminescence and cathodoluminescence studies of AlGaN

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Abstract

AlxGa1-xN films grown by MOCVD on sapphire and SiC substrates have been investigated by spatially resolved confocal photoluminescence microscopy and cathodoluminescence spectroscopy and mapping. The sample on SiC has a rougher topography, but it is much more uniform in emission intensity and wavelength than the sample on sapphire.

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All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Dierolf, V., Svitelskiy, O., Cargill, G. S., Nikiforov, A. Y., Redwing, J. M., & Acord, J. (2003). Confocal photoluminescence and cathodoluminescence studies of AlGaN. Materials Research Society Symposium - Proceedings, 798, 677-682.