Contact engineering for 2D materials and devices

Daniel S. Schulman, Andrew J. Arnold, Saptarshi Das

Research output: Contribution to journalReview article

75 Scopus citations

Abstract

Over the past decade, the field of two-dimensional (2D) layered materials has surged, promising a new platform for studying diverse physical phenomena that are scientifically intriguing and technologically relevant. Contacts are the communication links between these 2D materials and the three-dimensional world for probing and harnessing their exquisite electronic properties. However, fundamental challenges related to contacts often limit the ultimate performance and potential of 2D materials and devices. This article provides a comprehensive overview of the basic understanding and importance of contacts to 2D materials and various strategies for engineering and improving them. In particular, we elucidate the phenomenon of Fermi level pinning at the metal/2D contact interface, the Schottky versus Ohmic nature of the contacts and various contact engineering approaches including interlayer contacts, phase engineered contacts, and basal versus edge plane contacts, among others. Finally, we also discuss some of the relatively under-addressed and unresolved issues, such as contact scaling, and conclude with a future outlook.

Original languageEnglish (US)
Pages (from-to)3037-3058
Number of pages22
JournalChemical Society Reviews
Volume47
Issue number9
DOIs
StatePublished - May 7 2018

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All Science Journal Classification (ASJC) codes

  • Chemistry(all)

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