TY - JOUR
T1 - Controllable p-Type Doping of 2D WSe2 via Vanadium Substitution
AU - Kozhakhmetov, Azimkhan
AU - Stolz, Samuel
AU - Tan, Anne Marie Z.
AU - Pendurthi, Rahul
AU - Bachu, Saiphaneendra
AU - Turker, Furkan
AU - Alem, Nasim
AU - Kachian, Jessica
AU - Das, Saptarshi
AU - Hennig, Richard G.
AU - Gröning, Oliver
AU - Schuler, Bruno
AU - Robinson, Joshua A.
N1 - Funding Information:
A.K. and J.A.R. acknowledge Intel through the Semiconductor Research Corporation (SRC) Task 2746, the Penn State 2D Crystal Consortium (2DCC)‐Materials Innovation Platform (2DCC‐MIP) under NSF cooperative agreement DMR‐ 1539916, and NSF CAREER Award 1453924 for financial support. S.S. acknowledges funding from the Swiss National Science Foundation under SNSF project number 159690. A.M.Z.T. and R.G.H. were also funded by the NSF through the 2DCC‐MIP under award DMR‐1539916, and by additional awards DMR‐1748464 and OAC‐1740251. Computational resources were provided by the University of Florida Research Computing Center. The work of R.P. and S.D was supported by Army Research Office (ARO) through Contract Number W911NF1920338. S.B. and N.A. also acknowledge additional support provided by NSF CAREER DMR‐1654107 and Materials Characterization Lab at Penn State.
Funding Information:
A.K. and J.A.R. acknowledge Intel through the Semiconductor Research Corporation (SRC) Task 2746, the Penn State 2D Crystal Consortium (2DCC)-Materials Innovation Platform (2DCC-MIP) under NSF cooperative agreement DMR- 1539916, and NSF CAREER Award 1453924 for financial support. S.S. acknowledges funding from the Swiss National Science Foundation under SNSF project number 159690. A.M.Z.T. and R.G.H. were also funded by the NSF through the 2DCC-MIP under award DMR-1539916, and by additional awards DMR-1748464 and OAC-1740251. Computational resources were provided by the University of Florida Research Computing Center. The work of R.P. and S.D was supported by Army Research Office (ARO) through Contract Number W911NF1920338. S.B. and N.A. also acknowledge additional support provided by NSF CAREER DMR-1654107 and Materials Characterization Lab at Penn State.
Publisher Copyright:
© 2021 Wiley-VCH GmbH
PY - 2021/10/14
Y1 - 2021/10/14
N2 - Scalable substitutional doping of 2D transition metal dichalcogenides is a prerequisite to developing next-generation logic and memory devices based on 2D materials. To date, doping efforts are still nascent. Here, scalable growth and vanadium (V) doping of 2D WSe2 at front-end-of-line and back-end-of-line compatible temperatures of 800 and 400 °C, respectively, is reported. A combination of experimental and theoretical studies confirm that vanadium atoms substitutionally replace tungsten in WSe2, which results in p-type doping via the introduction of discrete defect levels that lie close to the valence band maxima. The p-type nature of the V dopants is further verified by constructed field-effect transistors, where hole conduction becomes dominant with increasing vanadium concentration. Hence, this study presents a method to precisely control the density of intentionally introduced impurities, which is indispensable in the production of electronic-grade wafer-scale extrinsic 2D semiconductors.
AB - Scalable substitutional doping of 2D transition metal dichalcogenides is a prerequisite to developing next-generation logic and memory devices based on 2D materials. To date, doping efforts are still nascent. Here, scalable growth and vanadium (V) doping of 2D WSe2 at front-end-of-line and back-end-of-line compatible temperatures of 800 and 400 °C, respectively, is reported. A combination of experimental and theoretical studies confirm that vanadium atoms substitutionally replace tungsten in WSe2, which results in p-type doping via the introduction of discrete defect levels that lie close to the valence band maxima. The p-type nature of the V dopants is further verified by constructed field-effect transistors, where hole conduction becomes dominant with increasing vanadium concentration. Hence, this study presents a method to precisely control the density of intentionally introduced impurities, which is indispensable in the production of electronic-grade wafer-scale extrinsic 2D semiconductors.
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U2 - 10.1002/adfm.202105252
DO - 10.1002/adfm.202105252
M3 - Article
AN - SCOPUS:85111039110
SN - 1616-301X
VL - 31
JO - Advanced Functional Materials
JF - Advanced Functional Materials
IS - 42
M1 - 2105252
ER -