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Dive into the research topics of 'Correlation of in-situ reflectance spectra and resistivity of GaN/Al <sub>2</sub>O<sub>3</sub> interfacial layer in metalorganic chemical vapor deposition'. Together they form a unique fingerprint.
Chemical Compounds
Metallorganic chemical vapor deposition
Growth temperature
Buffers
High electron mobility transistors
aluminum gallium nitride
Aluminum oxide
Screw dislocations
Electrons
Buffer layers
Surface morphology
Structural properties
Diffraction
Electric properties
Microscopes
X rays
Engineering & Materials Science
Metallorganic chemical vapor deposition
Growth temperature
High electron mobility transistors
Electrons
Screw dislocations
Buffer layers
Surface morphology
Structural properties
Diffraction
Electric properties
Microscopes
X rays
Physics & Astronomy
metalorganic chemical vapor deposition
buffers
reflectance
electrical resistivity
high electron mobility transistors
nuclei
screw dislocations
x ray diffraction
electrons
microscopes
electrical properties
conduction
high resolution