Coupled ion redistribution and electronic breakdown in low-alkali boroaluminosilicate glass

Doo Hyun Choi, Clive Randall, Eugene Furman, Michael Lanagan

Research output: Contribution to journalArticle

5 Scopus citations

Abstract

Dielectrics with high electrostatic energy storage must have exceptionally high dielectric breakdown strength at elevated temperatures. Another important consideration in designing a high performance dielectric is understanding the thickness and temperature dependence of breakdown strengths. Here, we develop a numerical model which assumes a coupled ionic redistribution and electronic breakdown is applied to predict the breakdown strength of low-alkali glass. The ionic charge transport of three likely charge carriers (Na+, H+/H3O+, Ba2+) was used to calculate the ionic depletion width in low-alkali boroaluminosilicate which can further be used for the breakdown modeling. This model predicts the breakdown strengths in the 108-109V/m range and also accounts for the experimentally observed two distinct thickness dependent regions for breakdown. Moreover, the model successfully predicts the temperature dependent breakdown strength for low-alkali glass from room temperature up to 150°C. This model showed that breakdown strengths were governed by minority charge carriers in the form of ionic transport (mostly sodium) in these glasses.

Original languageEnglish (US)
Article number084101
JournalJournal of Applied Physics
Volume118
Issue number8
DOIs
StatePublished - Aug 28 2015

    Fingerprint

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this