TY - JOUR
T1 - Critical behavior of the electrical resistance and its noise in inverted random-void systems
AU - Balberg, I.
AU - Wagner, N.
AU - Hearn, D. W.
AU - Ventura, Jose Antonio
PY - 1988/1/1
Y1 - 1988/1/1
N2 - A computer simulation of a representative continuum system, the inverted random-void model in three and six dimensions, is reported. It is the first such simulation where the local geometry of the conducting particles is taken into account. The results show that the critical behaviors of both the electrical resistivity and the resistance noise, near the percolation threshold, are well described by the recently suggested models of links in the nodes-links-blobs picture.
AB - A computer simulation of a representative continuum system, the inverted random-void model in three and six dimensions, is reported. It is the first such simulation where the local geometry of the conducting particles is taken into account. The results show that the critical behaviors of both the electrical resistivity and the resistance noise, near the percolation threshold, are well described by the recently suggested models of links in the nodes-links-blobs picture.
UR - http://www.scopus.com/inward/record.url?scp=5344266265&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=5344266265&partnerID=8YFLogxK
U2 - 10.1103/PhysRevLett.60.1887
DO - 10.1103/PhysRevLett.60.1887
M3 - Article
C2 - 10038168
AN - SCOPUS:5344266265
SN - 0031-9007
VL - 60
SP - 1887
EP - 1890
JO - Physical Review Letters
JF - Physical Review Letters
IS - 19
ER -