Critical behavior of the electrical resistance and its noise in inverted random-void systems

I. Balberg, N. Wagner, D. W. Hearn, Jose Antonio Ventura

Research output: Contribution to journalArticle

23 Scopus citations

Abstract

A computer simulation of a representative continuum system, the inverted random-void model in three and six dimensions, is reported. It is the first such simulation where the local geometry of the conducting particles is taken into account. The results show that the critical behaviors of both the electrical resistivity and the resistance noise, near the percolation threshold, are well described by the recently suggested models of links in the nodes-links-blobs picture.

Original languageEnglish (US)
Pages (from-to)1887-1890
Number of pages4
JournalPhysical Review Letters
Volume60
Issue number19
DOIs
StatePublished - Jan 1 1988

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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