Critical currents in Bi-Sr-Ca-Cu-O superconductors up to 33 T at 4.2 K

H. W. Weijers, B. Ten Haken, H. H.J. Ten Kate, J. Schwartz

Research output: Contribution to journalConference article

15 Scopus citations

Abstract

The I-V curves of Bi-Sr-Ca-Cu-O superconductors were measured in DC magnetic fields, oriented both parallel and perpendicular to the tape surface, up to 33 T, 4.2 K, in resistive magnets at the National High Magnetic Field Laboratory. This paper presents the experimental set-up, results of critical current measurements, and an analysis of the obtained Ic(B) curves in terms of strongly and weakly linked current paths. A distinct double-step behavior is observed for field perpendicular to the tape surface. The scaling behavior of the applied field with its component perpendicular to the ab-plane, and the implied average grain-misalignment angle, is investigated.

Original languageEnglish (US)
Pages (from-to)3956-3959
Number of pages4
JournalIEEE Transactions on Applied Superconductivity
Volume11
Issue number1 III
DOIs
StatePublished - Mar 1 2001
Event2000 Applied Superconductivity Conference - Virginia Beach, VA, United States
Duration: Sep 17 2000Sep 22 2000

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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