Critical currents of superconducting metal-oxide-semiconductor field-effect transistors

A. W. Kleinsasser, Thomas Nelson Jackson

Research output: Contribution to journalArticle

13 Citations (Scopus)

Abstract

A short-channel Si metal-oxide-semiconductor field-effect transistor that exhibited a Josephson supercurrent due to the proximity effect was reported recently. In this paper we point out that the dependence of the critical current of this gated weak link on channel carrier concentration is well described by a model that treats the device as a two-dimensional electron gas contacted by source and drain electrodes that are superconducting due to the proximity effect. The critical current is directly related to the boundary condition for the superconducting order parameter at the superconductor-semiconductor interfaces, which is determined by the probability for tunneling through the interfacial Schottky barriers, in contrast to the case of contacts to normal metals. We use a recent superconducting-field-effect-transistor experiment to demonstrate that theoretical results which have been widely and successfully applied to superconductor normal-metal superconductor weak links are not adequate to treat semiconductor-coupled weak links.

Original languageEnglish (US)
Pages (from-to)8716-8719
Number of pages4
JournalPhysical Review B
Volume42
Issue number13
DOIs
StatePublished - Jan 1 1990

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Critical currents
MOSFET devices
metal oxide semiconductors
Superconducting materials
critical current
field effect transistors
Metals
Semiconductor materials
Two dimensional electron gas
Field effect transistors
metals
Carrier concentration
electron gas
Boundary conditions
boundary conditions
Electrodes
electrodes
Experiments

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics

Cite this

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Critical currents of superconducting metal-oxide-semiconductor field-effect transistors. / Kleinsasser, A. W.; Jackson, Thomas Nelson.

In: Physical Review B, Vol. 42, No. 13, 01.01.1990, p. 8716-8719.

Research output: Contribution to journalArticle

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