Critical exponents for the contact process under the triangle condition

David J. Barsky; C. Chris Wu

doi:10.1023/a:1023036020125

Critical exponents for the contact process under the triangle condition

David J. Barsky, C. Chris Wu

Penn State Beaver

Research output: Contribution to journal › Article › peer-review

12 Scopus citations

Abstract

We show that a continuous-time version of the triangle condition for percolation implies mean-field values for several contact process critical exponents. Our results support the belief that the upper critical (spatial) dimension for the contact process is four.

Original language	English (US)
Pages (from-to)	95-124
Number of pages	30
Journal	Journal of Statistical Physics
Volume	91
Issue number	1-2
DOIs	https://doi.org/10.1023/a:1023036020125
State	Published - Apr 1998

All Science Journal Classification (ASJC) codes

Statistical and Nonlinear Physics
Mathematical Physics

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title = "Critical exponents for the contact process under the triangle condition",

abstract = "We show that a continuous-time version of the triangle condition for percolation implies mean-field values for several contact process critical exponents. Our results support the belief that the upper critical (spatial) dimension for the contact process is four.",

author = "Barsky, {David J.} and Wu, {C. Chris}",

year = "1998",

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AU - Wu, C. Chris

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AB - We show that a continuous-time version of the triangle condition for percolation implies mean-field values for several contact process critical exponents. Our results support the belief that the upper critical (spatial) dimension for the contact process is four.

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JF - Journal of Statistical Physics

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Critical exponents for the contact process under the triangle condition

Abstract

All Science Journal Classification (ASJC) codes

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