Critical thickness of the amorphous-nanocrystalline transition in Gd/Fe film structures

J. Landes, Ch Sauer, B. Kabius, W. Zinn

Research output: Contribution to journalArticlepeer-review

60 Scopus citations

Abstract

The growth of Gd/Fe layered structures prepared by evaporation in UHV was studied by means of in situ Fe57 conversion-electron Mössbauer spectroscopy and cross-section high-resolution transmission electron microscopy. The Fe layer grows on the Gd sublayer in an amorphous structure up to a critical Fe thickness of dc=2.30.1 nm. On further increasing the Fe thickness, a rapid transformation to nanocrystalline structure throughout the total Fe layer occurs. This effect is suggested to be due mainly to the extreme misfit between the structural parameters of Fe and Gd.

Original languageEnglish (US)
Pages (from-to)8342-8345
Number of pages4
JournalPhysical Review B
Volume44
Issue number15
DOIs
StatePublished - Jan 1 1991

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics

Fingerprint Dive into the research topics of 'Critical thickness of the amorphous-nanocrystalline transition in Gd/Fe film structures'. Together they form a unique fingerprint.

Cite this