Cross-phase modulation induced frequency shifting in silicon optical fibers

P. Mehta, N. Healy, T. D. Day, P. J.A. Sazio, J. V. Badding, A. C. Peacock

Research output: Contribution to conferencePaper

Abstract

We experimentally demonstrate cross-phase modulation (XPM) on a sub-picosecond timescale in a hydrogenated amorphous silicon-core, silica-clad optical fiber. Significant 10nm shifts in the probe wavelength are demonstrated through Kerr-induced refractive index changes.

Original languageEnglish (US)
StatePublished - Dec 1 2012
EventInformation Optoelectronics, Nanofabrication and Testing, IONT 2012 - Wuhan, China
Duration: Nov 1 2012Nov 2 2012

Other

OtherInformation Optoelectronics, Nanofabrication and Testing, IONT 2012
CountryChina
CityWuhan
Period11/1/1211/2/12

Fingerprint

Phase modulation
Silicon
Amorphous silicon
Silicon Dioxide
Optical fibers
Refractive index
Silica
Wavelength

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Materials Chemistry

Cite this

Mehta, P., Healy, N., Day, T. D., Sazio, P. J. A., Badding, J. V., & Peacock, A. C. (2012). Cross-phase modulation induced frequency shifting in silicon optical fibers. Paper presented at Information Optoelectronics, Nanofabrication and Testing, IONT 2012, Wuhan, China.
Mehta, P. ; Healy, N. ; Day, T. D. ; Sazio, P. J.A. ; Badding, J. V. ; Peacock, A. C. / Cross-phase modulation induced frequency shifting in silicon optical fibers. Paper presented at Information Optoelectronics, Nanofabrication and Testing, IONT 2012, Wuhan, China.
@conference{1b7d64d1b81a41b8b4ee17b04912e756,
title = "Cross-phase modulation induced frequency shifting in silicon optical fibers",
abstract = "We experimentally demonstrate cross-phase modulation (XPM) on a sub-picosecond timescale in a hydrogenated amorphous silicon-core, silica-clad optical fiber. Significant 10nm shifts in the probe wavelength are demonstrated through Kerr-induced refractive index changes.",
author = "P. Mehta and N. Healy and Day, {T. D.} and Sazio, {P. J.A.} and Badding, {J. V.} and Peacock, {A. C.}",
year = "2012",
month = "12",
day = "1",
language = "English (US)",
note = "Information Optoelectronics, Nanofabrication and Testing, IONT 2012 ; Conference date: 01-11-2012 Through 02-11-2012",

}

Mehta, P, Healy, N, Day, TD, Sazio, PJA, Badding, JV & Peacock, AC 2012, 'Cross-phase modulation induced frequency shifting in silicon optical fibers', Paper presented at Information Optoelectronics, Nanofabrication and Testing, IONT 2012, Wuhan, China, 11/1/12 - 11/2/12.

Cross-phase modulation induced frequency shifting in silicon optical fibers. / Mehta, P.; Healy, N.; Day, T. D.; Sazio, P. J.A.; Badding, J. V.; Peacock, A. C.

2012. Paper presented at Information Optoelectronics, Nanofabrication and Testing, IONT 2012, Wuhan, China.

Research output: Contribution to conferencePaper

TY - CONF

T1 - Cross-phase modulation induced frequency shifting in silicon optical fibers

AU - Mehta, P.

AU - Healy, N.

AU - Day, T. D.

AU - Sazio, P. J.A.

AU - Badding, J. V.

AU - Peacock, A. C.

PY - 2012/12/1

Y1 - 2012/12/1

N2 - We experimentally demonstrate cross-phase modulation (XPM) on a sub-picosecond timescale in a hydrogenated amorphous silicon-core, silica-clad optical fiber. Significant 10nm shifts in the probe wavelength are demonstrated through Kerr-induced refractive index changes.

AB - We experimentally demonstrate cross-phase modulation (XPM) on a sub-picosecond timescale in a hydrogenated amorphous silicon-core, silica-clad optical fiber. Significant 10nm shifts in the probe wavelength are demonstrated through Kerr-induced refractive index changes.

UR - http://www.scopus.com/inward/record.url?scp=84879019143&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84879019143&partnerID=8YFLogxK

M3 - Paper

AN - SCOPUS:84879019143

ER -

Mehta P, Healy N, Day TD, Sazio PJA, Badding JV, Peacock AC. Cross-phase modulation induced frequency shifting in silicon optical fibers. 2012. Paper presented at Information Optoelectronics, Nanofabrication and Testing, IONT 2012, Wuhan, China.