CUBIC: laboratory testing of 'thin poly' CCDs

Mark A. Skinner, David Nelson Burrows, Gordon P. Garmire, Ralph P. Kraft, David H. Lumb, John Andrew Nousek

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations

Abstract

CUBIC, the Cosmic Unresolved X-ray Background Instrument Using CCDs, is designed to make moderate resolution X-ray spectral measurements at spatial scales of a few degrees. While the energy range is nominally 200 eV - 10 keV, the CCDs have been designed to maximize the soft X-ray performance by using novel structures. The CUBIC CCDs, fabricated by Loral Fairchild, are 1024 × 1024 pixels in size, with 18 μm × 18 μm pixels. The CCDs use a new `thin poly' gate structure designed to maximize low energy quantum efficiency, while still retaining the advantages of front-side illumination and the high Charge Transfer Efficiency of a three-phase device. Being front-side illuminated, the design avoids the surface stability problems of backside illuminated devices. Fabrication of the first lot of CCDs and test structures has been completed, and we report laboratory camera testing of the CCDs at Penn State.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsOswald H. Siegmund
PublisherPubl by Society of Photo-Optical Instrumentation Engineers
Pages258-264
Number of pages7
ISBN (Print)0819412554
StatePublished - Dec 1 1993
EventEUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IV - San Diego, CA, USA
Duration: Jul 11 1993Jul 12 1993

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume2006
ISSN (Print)0277-786X

Other

OtherEUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IV
CitySan Diego, CA, USA
Period7/11/937/12/93

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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