Current status and future directions for in situ transmission electron microscopy

Mitra L. Taheri, Eric A. Stach, Ilke Arslan, P. A. Crozier, Bernd C. Kabius, Thomas LaGrange, Andrew M. Minor, Seiji Takeda, Mihaela Tanase, Jakob B. Wagner, Renu Sharma

Research output: Contribution to journalReview article

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This review article discusses the current and future possibilities for the application of in situ transmission electron microscopy to reveal synthesis pathways and functional mechanisms in complex and nanoscale materials. The findings of a group of scientists, representing academia, government labs and private sector entities (predominantly commercial vendors) during a workshop, held at the Center for Nanoscale Science and Technology- National Institute of Science and Technology (CNST-NIST), are discussed. We provide a comprehensive review of the scientific needs and future instrument and technique developments required to meet them.

Original languageEnglish (US)
Pages (from-to)86-95
Number of pages10
StatePublished - Nov 1 2016


All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

Cite this

Taheri, M. L., Stach, E. A., Arslan, I., Crozier, P. A., Kabius, B. C., LaGrange, T., Minor, A. M., Takeda, S., Tanase, M., Wagner, J. B., & Sharma, R. (2016). Current status and future directions for in situ transmission electron microscopy. Ultramicroscopy, 170, 86-95.