Current-voltage characteristics of Schottky barriers with barrier heights larger than the semiconductor band gap: The case of NiGen- (001) Ge contact

D. Z. Chi, R. T.P. Lee, S. J. Chua, S. J. Lee, S. Ashok, D. L. Kwong

Research output: Contribution to journalArticle

39 Scopus citations

Abstract

Current-voltage-temperature characterization has been performed on NiGen- (100) Ge Schottky contacts that were formed by the solid-state reaction of Ni with Ge. An effective barrier height of 0.732-0.735 eV, which is larger than the band-gap 0.66 eV of Ge, was obtained. A physical model describing the current transport mechanism in a Schottky contact with a barrier height larger than the semiconductor band gap is proposed and discussed on the basis of thermionic-field emission as the dominant transport mechanism. The observation of a barrier height larger than the semiconductor band gap should be of technological importance as it suggests that NiGe is an ideal contact and Schottky source/drain material in Ge-based p -metal-oxide-semiconductor field-effect-transistors.

Original languageEnglish (US)
Article number113706
JournalJournal of Applied Physics
Volume97
Issue number11
DOIs
StatePublished - Jun 30 2005

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Fingerprint Dive into the research topics of 'Current-voltage characteristics of Schottky barriers with barrier heights larger than the semiconductor band gap: The case of NiGen- (001) Ge contact'. Together they form a unique fingerprint.

  • Cite this