Damage analysis of benzene induced by keV fullerene bombardment

B. Czerwinski, L. Rzeznik, R. Paruch, B. J. Garrison, Z. Postawa

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

Molecular dynamics computer simulations have been used to investigate the damage of a benzene crystal induced by 5 keV C20, C60, C120 and C180 fullerene bombardment. The sputtering yield, the mass distributions, and the depth distributions of ejected organic molecules are analyzed as a function of the size of the projectile. The results indicate that all impinging clusters lead to the creation of almost hemispherical craters, and the process of crater formation only slightly depends on the size of the fullerene projectile. The total sputtering yield as well as the efficiency of molecular fragmentation are the largest for 5 keV C20, and decrease with the size of the projectile. Most of the molecules damaged by the projectile impact are ejected into the vacuum during cluster irradiation. Similar behavior does not occur during atomic bombardment where a large portion of fragmented benzene molecules remain inside the crystal after projectile impact. This "cleaning up" effect may explain why secondary ion mass spectrometry (SIMS) analysis of some organic samples with cluster projectiles can produce significantly less accumulated damage compared to analysis performed with atomic ion beams.

Original languageEnglish (US)
Pages (from-to)1440-1443
Number of pages4
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume267
Issue number8-9
DOIs
StatePublished - May 1 2009

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics
  • Instrumentation

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