Dangling bonds and the Urbach tail in silicon

C. H. Seager, Patrick M. Lenahan, K. L. Brower, R. E. Mikawa

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

Electron spin resonance (ESR) and highly sensitive optical-absorption measurements have been performed on plastically deformed silicon, polycrystalline silicon, and high interface state density, oxidized silicon samples. In the first two cases, the response of the Urbach-like subgap optical absorption and the "dangling bond" ESR signal following thermal and atomic hydrogen anneals is found to be distinctly different from that reported previously for polycrystalline silicon. These data suggest that transitions of the dangling bond are not responsible for this Urbach-like behavior. In addition, we find that removal of the interfacial silicon dangling bond by oxide stripping results in no measurable sample absorptance decreases, implying a considerably lower optical cross section than has been previously estimated for dangling bonds in the bulk.

Original languageEnglish (US)
Pages (from-to)2704-2708
Number of pages5
JournalJournal of Applied Physics
Volume58
Issue number7
DOIs
StatePublished - Dec 1 1985

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silicon
electron paramagnetic resonance
optical absorption
absorptance
stripping
oxides
cross sections
hydrogen

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

Seager, C. H. ; Lenahan, Patrick M. ; Brower, K. L. ; Mikawa, R. E. / Dangling bonds and the Urbach tail in silicon. In: Journal of Applied Physics. 1985 ; Vol. 58, No. 7. pp. 2704-2708.
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Seager, CH, Lenahan, PM, Brower, KL & Mikawa, RE 1985, 'Dangling bonds and the Urbach tail in silicon', Journal of Applied Physics, vol. 58, no. 7, pp. 2704-2708. https://doi.org/10.1063/1.335907

Dangling bonds and the Urbach tail in silicon. / Seager, C. H.; Lenahan, Patrick M.; Brower, K. L.; Mikawa, R. E.

In: Journal of Applied Physics, Vol. 58, No. 7, 01.12.1985, p. 2704-2708.

Research output: Contribution to journalArticle

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T1 - Dangling bonds and the Urbach tail in silicon

AU - Seager, C. H.

AU - Lenahan, Patrick M.

AU - Brower, K. L.

AU - Mikawa, R. E.

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