Defect analytics in a high-end server manufacturing environment

Faisal Aqlan, Chanchal Saha, Sreekanth Ramakrishnan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Server manufacturing is characterized by extensive test processes to ensure high quality and reliability of the servers. Server components are obtained from different suppliers who may have different specifications. Although outsourcing of components provides many potential benefits to the company, it can also cause quality issues. If quality issues are not addressed effectively at the initial stages, defects can transit through the supply chain. Thus, quality control is one of the major challenges for the high-end server manufacturing industries. Defective parts are either disposed, repaired, or returned to the supplier depending on the type of defects. Product quality is ensured through multiple test processes at the manufacturing and design stages are substantially expensive. The defect-related quality test results are stored in different databases in both structured and unstructured data format. In this study, defect analytics models are used for defect assessment of more than 5,000 different defect instances collected from different databases sources of a high-end server manufacturing environment. Analytics models including cluster analysis, neural networks, and text mining to characterize and predict the defect root causes and solutions. The proposed defect analytics framework replaced the current manual defect analysis method which is based on trial and error.

Original languageEnglish (US)
Title of host publicationIIE Annual Conference and Expo 2015
PublisherInstitute of Industrial Engineers
Pages892-900
Number of pages9
ISBN (Electronic)9780983762447
StatePublished - Jan 1 2015
EventIIE Annual Conference and Expo 2015 - Nashville, United States
Duration: May 30 2015Jun 2 2015

Publication series

NameIIE Annual Conference and Expo 2015

Other

OtherIIE Annual Conference and Expo 2015
CountryUnited States
CityNashville
Period5/30/156/2/15

All Science Journal Classification (ASJC) codes

  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering

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  • Cite this

    Aqlan, F., Saha, C., & Ramakrishnan, S. (2015). Defect analytics in a high-end server manufacturing environment. In IIE Annual Conference and Expo 2015 (pp. 892-900). (IIE Annual Conference and Expo 2015). Institute of Industrial Engineers.